Regensburg 2010 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 59: Poster Session II (Nanostructures at surfaces: Dots, particles, clusters; Nanostructures at surfaces: arrays; Nanostructures at surfaces: Wires, tubes; Nanostructures at surfaces: Other; Plasmonics and nanooptics; Metal substrates: Epitaxy and growth; Metal substrates: Solid-liquid interfaces; Metal substrates: Adsoprtion of organic / bio molecules; Metal substrates: Adsoprtion of inorganic molecules; Metal substrates: Adsoprtion of O and/or H; Metal substrates: Clean surfaces; Density functional theory and beyond for real materials)

O 59.20: Poster

Mittwoch, 24. März 2010, 17:45–20:30, Poster B1

Conductive AFM on Supramolecular Assemblies — •Carsten Hentschel¹, Daniel Ebeling¹, Lin Jiang^1,2, Harald Fuchs¹, and Lifeng Chi¹ — ¹Center for Nanotechnology (CeNTech) and Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Germany — ²present address: School of Materials Science and Engineering, Nanyang Technological University, Singapore

Based on the continuous reduction of electronic device sizes there is an increasing interest in conductors of molecular dimensions. As a result of these molecular dimensions the atomic force microscope (AFM) has developed for a suitable standard tool for surface analysis in this range.

However, among the mechanical characterisation it is possible to measure electrical properties of samples by this technique. Therefore, a conductive cantilever tip is scanned over a sample surface while a bias voltage is applied between tip and sample. With an external current amplifier the local current between tip and surface is measurable [1-2].

Here we will present a method to perform conductivity measurements with nanoscopic resolution on supramolecular assemblies. Therefore, the topographical images and current maps are simultaneously recorded in order to study the electrically behaviour on a length of about several micrometers.

[1] H. Dai, E. W. Wong, C. M. Liebert, Science 272 (1996)

[2] P. J de Pablo et al., Phys. Rev. Lett. 88 (2002) 036804