DPG Phi
Verhandlungen
Verhandlungen
DPG

Regensburg 2010 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe

O: Fachverband Oberflächenphysik

O 87: Methods: Other (experimental)

O 87.3: Vortrag

Freitag, 26. März 2010, 11:45–12:00, H42

A fast, full multichannel reflectance difference spectrometer — •Chunguang Hu1,2, Lidong Sun1, Michael Hohage1, and Peter Zeppenfeld11Institut für Experimentalphysik, Johannes-Kepler-Universität Linz, Austria — 2State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, China

With its high surface sensitivity, reflectance difference spectroscopy (RDS) has been proven to be a versatile tool for the scientific research in surface science and thin film growth. We report the development of a fast, multiwavelength RD spectrometer using a rotating compensator (RC) for signal modulation. The new spectrometer measures the optical anisotropy in the entire spectral range from 1.5 to >4.5eV simultaneously using a photodiode array with 1024 channels as detector. We will demonstrate that the new RDS is particularly suitable for in-situ monitoring of thin film growth and other surface processes by illustrating its application in the research of organic thin film growth.

100% | Mobil-Ansicht | English Version | Kontakt/Impressum/Datenschutz
DPG-Physik > DPG-Verhandlungen > 2010 > Regensburg