Dresden 2011 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 56: [DS] Progress in Micro- and Nanopatterning: Techniques and Applications III (Focused Session, jointly with O - Organisers: Graaf, Hartmann)
O 56.6: Vortrag
Mittwoch, 16. März 2011, 16:15–16:30, GER 38
Swift Heavy Ion Beam Shaping Of Sub-Micron Structures — •R. Ferhati1, N. Guilliard1, T. Weishaar1, S. Amirthapandian1, M. Fritschke2, L. Bischoff2, and W. Bolse1 — 1Institut für Halbleiteroptik und Funktionelle Grenzflächen, Universität Stuttgart — 2Forschungszentrum Dresden
Already in 1983 it was discovered, that swift heavy ion (SHI) irradiation of metallic glasses results in anisotropic deformation (shrinking along the beam direction expansion in perpendicular directions) [1]. We have employed this "hammering effect" to reshape sub-micrometer structures by SHI bombardment under proper variation of the beam incidence angle. Utilizing the focused ion beam (FIB) technique, a rectangular grid with varying lateral distances of 100 to 5000 nm was cut into a 100 nm thick NiO- resp. ZnO-film from their surfaces down to the oxidized Si-substrate, in order to produce small oxide "ashlars". The samples were then irradiated under grazing incidence and continuous azimuthal target rotation with 1.4 GeV U- (NiO) and 0.95 GeV Au-ions (ZnO), respectively, in our new in-situ SEM at the UNILAC accelerator of GSI [2]. After certain fluence steps, the irradiation was stopped and one and the same spot was analyzed by means of SEM in order to investigate the evolution of the irradiated objects. Depending on their initial size complex structures (egg-, cone-, pillar-, forceps-, tooth-like) were formed, which can only be understood if besides the hammering effect deformation due to surface tension and yield stress are taken into account. [1] S. Klaumünzer, G. Schumacher, Phys. Rev. Lett. 51 (1983), [2] S. Amirthapandian, et al., Rev.Sci.Instr. 81, (2010)