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DS: Fachverband Dünne Schichten

DS 20: Application of thin films

DS 20.2: Vortrag

Mittwoch, 28. März 2012, 09:45–10:00, H 0111

Single-Shot Imaging of Transient Reflectivity Changes for Temporal Jitter Characterization in Ultrafast X-ray Pump-Probe ExperimentsM. Beye3, M. Bionta2, S. de Jong2, A. Galler1, C. Graves2, J. Gruenert1, M. Holmes2, O. Krupin1,2, •B. Li1, R. Marvel4, M. Minitti2, A. Reid2, and W. F. Schlotter21European XFEL GmbH, Hamburg, Germany — 2SLAC National Accelerator Laboratory, CA 94025, USA — 3Helmholtz Zentrum Berlin, Germany — 4Vanderbilt University, Nashville 37235, USA

The X-ray Free-Electron-Laser sources will enable frontier research in the studies of extremely small structures (angstrom resolution) and extremely fast phenomena (<10 fs) at the same time. The origin of a Self-Amplified Spontaneous Emission-based FEL is the shot noise in the electron bunch, and thus each individual FEL pulse is different in terms of pulse energy, spectrum, wavefront, temporal properties etc. Measuring the temporal profile of the ultrafast FEL pulse remains a very challenging topic [1-2]. Here we report on recent results from a research campaign at the LCLS SXR instrument, where single-shot images of the cross-correlation of XFEL pulses and infrared laser pulses are measured and analyzed. The X-ray induced transient change of optical reflectivity is observed and the time delay in-between the X-ray pulses and optical laser pulses could also be derived preliminarily.

[1] Nature Photonics, 2, 165 (2008). [2] J. Phys. B: At. Mol. Opt. Phys., 43, 194010 (2010).

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DPG-Physik > DPG-Verhandlungen > 2012 > Berlin