DPG Phi
Verhandlungen
Verhandlungen
DPG

Berlin 2012 – scientific programme

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DS: Fachverband Dünne Schichten

DS 27: Thin film characterization: structure analysis and composition (post growth analysis XRD, etc..)

Wednesday, March 28, 2012, 16:30–17:30, H 2032

16:30 DS 27.1 Molecular beam epitaxy of Ge-Sb-Te thin films on Si substrates — •Alessandro Giussani, Perumal Karthick, Peter Rodenbach, Michael Hanke, Wolfgang Braun, Raffaella Calarco, and Henning Riechert
16:45 DS 27.2 Structural properties of MBE-grown Bi2SexTe3−x layers — •Steffen Schreyeck, Christian Kehl, Nadezda V. Tarakina, Tanja Borzenko, Claus Schumacher, Grzegorz Karczewski, Jean Geurts, Karl Brunner, and Laurens W. Molenkamp
17:00 DS 27.3 X-ray Resonant Reflectivity study of Transition Metal Oxides — •Sebastian Macke, Jorge Hamann-Borrero, Abdullah Radi, Ronny Sutarto, George Christiani, Gennady Logvenov, George Sawatzky, Bernhard Keimer, and Vladimir Hinkov
17:15 DS 27.4 Growth of lead-free piezoelectric thin films of 0.92 (Bi0.5Na0.5TiO3)-0.8 BaTiO3 (BNT-BT) by pulsed laser deposition — •Mehrdad Baghaie Yazdi, Christian Bausch, Torsten Granzow, Wook Jo, and Lambert Alff
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