Berlin 2012 –
wissenschaftliches Programm
DS 28: Thin film characterization: structure analysis and composition (Spectroscopy)
Mittwoch, 28. März 2012, 17:45–19:45, H 2032
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17:45 |
DS 28.1 |
X-ray absorption and resonant photoelectron spectroscopy of epitaxial Fe-doped SrTiO3 — •Annemarie Köhl, Christian Lenser, Dariusz Kajewski, Jurek Kubacki, Chencheng Xu, Sebastian Wicklein, Jacek Szade, and Regina Dittmann
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18:00 |
DS 28.2 |
Quantitaive and wavelenght dispersive x-ray fluorescence spectrometry of buried nanostructures — •Rainer Unterumsberger, Beatrix Pollakowski, Falk Reinhardt, Matthias Müller, and Burkhard Beckhoff
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18:15 |
DS 28.3 |
X-Ray induced characterization of ion implantation depth profiles — •Philipp Hönicke and Burkhard Beckhoff
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18:30 |
DS 28.4 |
Direct Fourier imaging of distortions in LaAlO3 Films — •Christoph Schlueter, Tien-Lin Lee, Carmela Aruta, and Jörg Zegenhagen
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18:45 |
DS 28.5 |
Chemical Depth Profiles of Ternary Pd Alloys by HAXPES and First Spectra Simulations — •Julius Kühn, Andreas Lippitz, Thomas Gross, Mihaela Gorgoi, Sebastian Linke, Werner Moritz, and Wolfgang Unger
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19:00 |
DS 28.6 |
Factor Analysis and Advanced Inelastic Background Analysis in XPS: Unraveling time dependent contamination growth on multilayers and thin films — •Sina Gusenleitner, Tina Graber, Dirk Ehm, and Friedrich Reinert
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19:15 |
DS 28.7 |
Structure determination of monolayer FeO(111) films on Ag(001) — •Daniel Bruns, Irena Kiesel, Steffen Jentsch, Soeren Lindemann, Christian Otte, Timo Kuschel, and Joachim Wollschlaeger
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19:30 |
DS 28.8 |
Lattice dynamics and magnetism of metallic Samarium in Sm-type and dhcp structured films — •Olga Bauder, Alessando Barla, Ilia Sergueev, Rudolf Rüffer, and Svetoslav Stankov
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