Berlin 2012 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 34: Organic thin films II: Interface spectroscopy

DS 34.8: Vortrag

Donnerstag, 29. März 2012, 16:45–17:00, H 2032

Quantitative blend analysis of polymer/fullerene films via spectroscopic ellipsometry — •Sebastian Engmann, Vida Turkovic, Harald Hoppe, and Gerhard Gobsch — Technische Universität Ilmenau, Institut für Physik, Experimentalphysik 1, Weimarer Straße 32, 98693 Ilmenau

Spectroscopic ellipsometry (SE) was used to determine the shape of fullerene inclusions in polymer/fullerene blends. The spatial distribution of the fullerene phase over the film depth is investigated, and we found evidence for spinodal de-mixing. The time development of the phase separations are investigated. Furthermore, ellipsometric measurements, in combination with refined optical modeling, are used to quantitatively describe the degree of spatial order of the polymer phase within polymer/fullerene blends.