Berlin 2012 –
            
              wissenschaftliches Programm
            
          
        
        
        
        
        
      
      
  
    
  
  HL 40: Impurities / Amorphous Semiconductors
  Dienstag, 27. März 2012, 11:30–13:15, EW 015
  
    
  
  
    
      
        
          
            
              |  | 11:30 | HL 40.1 | The dangling-bond defect in crystalline and amorphous silicon: insights from ab initio calculations of EPR parameters — •Gernot Pfanner, Christoph Freysoldt, and Jörg Neugebauer | 
        
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              |  | 11:45 | HL 40.2 | Vibrational spectra of charged point defects in ionic oxides — Jianchuan Wang, •Christoph Freysoldt, and Jörg Neugebauer | 
        
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              |  | 12:00 | HL 40.3 | Evidence for Fe2+ in Wurtzite Coordination: Iron Doping Stabilizes ZnO Nanoparticles — •Jianping Xiao, Agnieszka Kuc, Suman Pokhrel, Marco Schowalter, Satyam Parlapalli, Andreas Rosenauer, Thomas Frauenheim, Lutz Mädler, Lars Pettersson, and Thomas Heine | 
        
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              |  | 12:15 | HL 40.4 | Defects in amorphous silicon nitrides: Si3N4-Si3Nx — •Leif Eric Hintzsche, Georg Kresse, Martijn Marsmann, Gerald Jordan, Changming Fang, and Thomas Watts | 
        
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              |  | 12:30 | HL 40.5 | Charge Carrier Density Control in In-based Multi Compound Solution Processed Oxide TFTs — •Marlis Ortel, Marko Marinkovic, Gesa Helms, and Veit Wagner | 
        
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              |  | 12:45 | HL 40.6 | THz spectroscopy of the 29 cm−1 oxygen vibrational line in natural silicon and isotopically enriched 28Si — •Kurt Lassmann, Boris Gorshunov, P.S. Korolev, E.S. Zhukova, V.P. Kalinsuhkin, N.V. Abrosimov, P.G. Sennikov, H.-J. Pohl, S. Zakel, and Martin Dressel | 
        
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              |  | 13:00 | HL 40.7 | Diffusion of Cu (I) in amorphous In2S3 thin films investigated by Rutherford backscattering spectroscopy — •Albert Juma, Paul Pistor, Thomas Dittrich, and Elke Wendler | 
        
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