Berlin 2012 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
KR: Fachgruppe Kristallographie
KR 10: Crystallography in Nanoscience
KR 10.3: Vortrag
Donnerstag, 29. März 2012, 10:20–10:40, E 124
In-situ 3D reciprocal space mapping during mechanical deformation — •Thomas Cornelius1, Anton Davydok2, Dina Carbone3, Vincent Jacques3, Raphael Grifone3, Marie-Ingrid Richard1, Till Hartmut Metzger4, Tobias Schülli3, Ullrich Pietsch2, and Olivier Thomas1 — 1IM2NP, CNRS, Marseille, France — 2Siegen University, Siegen, Germany — 3ESRF, Grenoble, France — 4MPI of Colloids and Interfaces, Potsdam, Germany
In recent years, low-dimensional materials attracted enormous attention due to size effects which originate from the spatial confinement of the nanostructures affecting their properties. At the beamline ID01 at ESRF, an in-situ AFM was developed for mechanical studies on nanostructures in combination with nanofocused XRD. The X-ray beam is focused to few hundred nanometers and the diffracted X-rays are recorded by a 2D detector. To record the complete structural change during deformation, it is mandatory to measure in-situ the 3D intensity distribution. Since any movement of diffractometer motors induces vibrations leading to the destruction of the AFM-tip and/or the nano-object during compression, ordinary rocking curves cannot be applied. We developed a novel energy tuning approach which allows for the acquisition of 3D-XRD maps during in-situ compression tests and, thus, giving access to the deformation of the structure under investigation. Here, we will present in situ 3D-XRD studies on SiGe islands which served as a model system.