Regensburg 2013 – wissenschaftliches Programm
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DF: Fachverband Dielektrische Festkörper
DF 19: Poster 2
DF 19.6: Poster
Mittwoch, 13. März 2013, 15:00–17:30, Poster B2
Structural and Compositional Inhomogeneity of a Fe-SrTiO3 Film Studied by Electron Microscopy and Spectroscopy — •Hongchu Du1,2,3, Chun-Lin Jia1,2, and Joachim Mayer1,2,3 — 1Ernst Ruska-Centrum für Mikroskopie und Spektroskopie mit Elektronen, Forschungszentrum Jülich GmbH, Jülich, 52425, Germany — 2Peter Grünberg Institut, Forschungszentrum Jülich GmbH, Jülich, 52425, Germany — 3Gemeinschaftslabor für Elektronenmikroskopie (GFE), RWTH Aachen, Aachen, 52074, Germany
Lattice defects are essential for the microscopic switching mechanism in all the classes of the resistive switching effects. Hence a thorough understanding of electronically active defects is required to be able to correlate microscopic structures with the resistively switching properties. Aberration corrected High-resolution (S)TEM provides real structural analysis down to the atomic level. Different techniques like HRTEM, ADF-STEM, and EELS enable revealing the microscopic details of the electronically active defects, thereby allowing a better understanding of how lattice defects interrelate with the resistively switching effects.
In this study, we observed that the Fe-SrTiO3 film has structural and compositional inhomogeneity by HRTEM, STEM, and EELS. Lattice parameter increment was observed in both the distort particle-like area and antiphase boundaries. The antiphase boundaries may be formed by 1/2 unit cell displacement of the antiphase domain in [110] direction with respect to the film. EELS profile shows that Fe are mainly distributed in the film. Enrichment of Fe was found in the strained area and at the interface.