Regensburg 2013 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 13: Poster Session III: Layer properties: electrical, optical and mechanical properties; Thin film characterization: structure analysis and composition (XRD, TEM; XPS, SIMS, RBS..)

DS 13.20: Poster

Montag, 11. März 2013, 17:00–20:00, Poster B1

Photoemission Analysis of PLD grown Oxide Heterointerfaces — •Uwe Treske, Andreas Koitzsch, Martin Knupfer, and Bernd Büchner — Institute for Solid State Research, IFW-Dresden, P.O.Box 270116, D-01171 Dresden, Germany

Pulsed laser deposition enables monolayer controlled growth of transition metal oxide heterointerfaces with a variety of exotic phenomena depending on the growth conditions. A prominent example is the formation of a high-mobility two-dimensional electron gas at the interface of LaAlO₃ grown on TiO₂-terminated SrTiO₃ substrates. The origin of conductivity at the interface of such insulating oxides is still under discussion. The polar catastrophe, oxygen vacancies and also cation intermixing should be taken into account. We apply soft x-ray photoemission studies to investigate stoichiometric aspects as well as in-gap states and differences in the core levels depending on the layer thickness.