Regensburg 2013 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 27: Thin Film Characterization: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS,...) I

DS 27.1: Vortrag

Mittwoch, 13. März 2013, 17:15–17:30, H32

In-situ GISAXS study of the gold electrode growth on spiro-OMeTAD films — •Martin A. Niedermeier¹, Ezzeldin Metwalli¹, Volker Körstgens¹, Jan Perlich², Ralf Röhlsberger², Stephan V. Roth², and Peter Müller-Buschbaum¹ — ¹TU München, Physik Department, LS Funktionelle Materialien, James-Franck-Str. 1, 85748 Garching, Germany — ²HASYLAB at DESY, Notkestraße 85, 22603 Hamburg, Germany

In the fast developing field of organic electronics, thin metal films play a huge role as they are commonly applied as electrode materials. One prominent example is the field of photovoltaics which has taken on greater significance in the recent years due the energy challenges of modern society. A well-defined organic/metal interface is crucial for a good overall device performance. For a profound understanding of that interface, the morphology and the incorporation of the electrode material into the organic film is essential. However, so far only little fundamental knowledge is available on this topic.

In this work, we present an in-situ investigation of the gold electrode growth via sputter deposition on top of a spiro-OMeTAD film, which is a commonly used system in solid-state dye sensitized solar cells. We used grazing incidence small angle x-ray scattering (GISAXS) with high time resolution to follow the real time evolution of the gold electrode growth and obtain information about the growth kinetics. Additionally, enrichment layers of gold into the organic film are investigated with x-ray reflectivity. Therefore, we obtain a good fundamental understanding of the electrode/organic semiconductor interface.