Regensburg 2013 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 30: Thin Film Characterization: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS,...) II
DS 30.6: Vortrag
Donnerstag, 14. März 2013, 16:00–16:15, H32
On the similarity of multiple scattering and the Moiré Effect in reciprocal space and how to make use of it in LEED — •Matthias Meissner1, Falko Sojka1, Marcel Grosch1, Thomas Dienel2, and Torsten Fritz1 — 1University of Jena, Institute of Solid State Physics, Max-Wien-Platz 1, 07743 Jena, Germany — 2Empa, nanotech@surfaces, Überlandstrasse 129, CH-8600 Dübendorf, Switzerland
The effect of multiple scattering of electrons during low-energy electron diffraction (LEED) has been described decades ago. Likewise, the formation of Moiré patterns at the interface of different surface lattices is a well-known and common feature in surface physics. By definition, they are two distinct effects with different origins. However, in reciprocal space both can be treated very similarly, few assumptions provided.
It will be shown that this can be used as a powerful tool to analyze LEED patterns of systems where Moiré effects occur, e.g. Al2O3 on Ni3Al(111) and boron nitride on Pt(111), or in organic-inorganic hetero-epitaxy, e.g. peri-hexabenzocoronene (HBC) on graphite. Additionally, a kinematic approach to calculate spot intensities, even though imperfect to fully account for all influences on intensity, can help to understand LEED patterns, for example in the cases of few layer graphene on SiC(0001) and Al2O3 on Ni3Al(111).