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14:45 |
DS 30.1 |
CVD and ALD deposited hafnia: an XPS study — •Simone Brizzi, Massimo Tallarida, and Dieter Schmeisser
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15:00 |
DS 30.2 |
Formation of ultrathin silica/iron-oxide epitaxial layers on Ru(0001) — •xin yu, anibal boscoboinik, bing yang, shamil Shaikhutdinov, and Hajo Freund
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15:15 |
DS 30.3 |
Composition and Chemistry of a Pd-Ni-Co thin film alloy studied by HAXPES — •Julius Kühn, Andreas Lippitz, Mihaela Gorgoi, Kai Nörthemann, Werner Moritz, and Wolfgang Unger
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15:30 |
DS 30.4 |
Nickel Induced Crystallization of Carbon During Deposition — •Robert Wenisch, Sibylle Gemming, and Gintautas Abrasonis
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15:45 |
DS 30.5 |
Substrate strains measured by convergent beam electron diffraction in epitaxial Ba(Fe1-xCox)2As2 thin films — •Paul Chekhonin, Jan Engelmann, Bernhard Holzapfel, Bernd Rellinghaus, Carl-Georg Oertel, and Werner Skrotzki
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16:00 |
DS 30.6 |
On the similarity of multiple scattering and the Moiré Effect in reciprocal space and how to make use of it in LEED — •Matthias Meissner, Falko Sojka, Marcel Grosch, Thomas Dienel, and Torsten Fritz
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16:15 |
DS 30.7 |
Momentum-resolved Energy Loss Spectroscopy of Ultrathin Oxide Layers — •Kinyanjui Michael, Gerd Benner, Giuseppe Pavia, Nicolas Gauquelin, Gianluigi Botton, Hans-Ulrich Habermeier, Eva Benckiser, Bernhard Keimer, and Ute Kaiser
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16:30 |
DS 30.8 |
Quantitative Analysis of REELS Spectra and Modeling of Optical Properties of Multilayer systems for EUV Radiation Regime — Evelyn Handick, •Sina Gusenleitner, Dirk Hauschild, Tina Graber, Dirk Ehm, and Friedrich Reinert
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16:45 |
DS 30.9 |
EBSD on thin FePtCu films to investigate the influence of copper content and annealing temperature on (001) texture formation and grain size — •Nathanael Jöhrmann, Herbert Schletter, Christoph Brombacher, Manfred Albrecht, and Michael Hietschold
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17:00 |
DS 30.10 |
Einfache Methode zur Steigerung der Empfindlichkeit in Null-Ellipsometrie — •Marco Muth, Reiner P. Schmid und Klaus Schnitzlein
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