Regensburg 2013 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

DS: Fachverband Dünne Schichten

DS 32: Poster Session IV: Atomic layer deposition; Organic thin films; Organic Electronics and Phototovoltaics; Organic Materials for Spintronics - from spinterface to devices; Thin film photovoltaic materials and solar cells

DS 32.30: Poster

Donnerstag, 14. März 2013, 17:00–20:00, Poster B2

Degradation processes in naphthalene diimide n–type and flexo printed polytriarylamine p–type organic field effect transistors studied by IR ellipsometry and electrical characterizations — •Jens Trollmann, Michael Sendner, and Annemarie Pucci — Kirchhoff-Institut für Physik der Universität Heidelberg

Degradation processes in organic field effect transistors is a subject not well studied yet. Especially for printed layers there is few data available. We compare variations in mid-infrared (IR) ellipsometrical spectra of evaporated naphthalene diimide thin films with changes in the electrical properties of transistors after degradation by water vapour and heat (65^∘C, 85%rH). Furthermore we investigate flexo printed polytriarylamine layers degraded under the same conditions. The variations of vibrational modes of atmonic bonds during degradation reveal morphological and chemical changes in organic thin films causing losses in electrical performance. Based on this information procedures to avoid serious losses can be developed. Funding by BMBF (Polytos) is gratefully acknowledged.