MI 6: X-ray Imaging, Holography and Tomography
Mittwoch, 13. März 2013, 09:30–10:45, H5
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09:30 |
MI 6.1 |
About the Potential of novel X-ray Contrast Modalities in Material Science and Non-Destructive Testing — •Friedrich Prade, Michael Chabior, and Franz Pfeiffer
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09:45 |
MI 6.2 |
OMNY- An Instrument for Ptychographic Nano-Tomography — Mirko Holler, •Jörg Raabe, Ana Diaz, Manuel Guizar-Sicairos, Christoph Quitmann, Andreas Menzel, and Oliver Bunk
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10:00 |
MI 6.3 |
Advanced image processing algorithms for coherent X-ray nanoCT — •Benedikt Daurer, Björn Enders, Andreas Fehringer, Marco Stockmar, Martin Dierolf, Irene Zanette, Franz Pfeiffer, and Pierre Thibault
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10:15 |
MI 6.4 |
3D validation of X-Ray Diffraction Contrast Tomography reconstructions of polycristalline materials by means of serial sectioning and EBSD analysis — •Barbara Lödermann, Andreas Graff, Andreas Trenkle, Melanie Syha, Mathias Reichardt, Michael Selzer, Daniel Weygand, Wolfgang Ludwig, and Peter Gumbsch
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10:30 |
MI 6.5 |
The Potential of Scatter-Free Pinholes for X-ray Analytical Equipment — •Andreas Kleine, Frank Hertlein, and Carsten Michaelsen
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