MI 7: Ion Beam Methods
Mittwoch, 13. März 2013, 11:00–12:15, H5
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11:00 |
MI 7.1 |
The He Ion Microscope: Extending the frontiers of nanoscale research — •Peter Gnauck
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11:30 |
MI 7.2 |
Broadening of a helium beam in hydrogen silsesquioxane — •Paul Alkemade, Anja van Langen-Suurling, Emile van Veldhoven, and Diederik Maas
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11:45 |
MI 7.3 |
Ultra-high 2D and 3D imaging SIMS with cluster ions - approaching the physical limits — •Sven Kayser, Felix Kollmer, Wolfgang Paul, Martin Krehl, and Ewald Niehuis
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12:00 |
MI 7.4 |
A position sensitive germanium detector for the measurement of angular deviation of positron-electron annihilation radiation — •Benjamin Löwe, Markus Reiner, Werner Egger, Christoph Hugenschmidt, and Günther Dollinger
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