Regensburg 2013 – wissenschaftliches Programm

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MI: Fachverband Mikrosonden

MI 9: Poster: Microanalysis and Microscopy

MI 9.9: Poster

Mittwoch, 13. März 2013, 15:00–17:00, Poster B2

Coupling Kelvin Probe Force Microscopy and Raman Spectroscopy — •Susanne Müller, Raul D. Rodriguez, Evgeniya Sheremet, Alexander Villabona, and Dietrich R.T. Zahn — Semiconductor Physics Group, Chemnitz University of Technology, 09126 Chemnitz, Germany

The Atomic Force Microscope (AFM) is currently one of the most used tools to investigate the topography of samples with nanometer resolution in three dimensions. However, the AFM lacks chemical sensitivity. Therefore, in order to simultaneously achieve chemical information, the AFM needs to be equipped with electrical or optical capabilities. The most prominent techniques in these fields are Kelvin probe force microscopy (KPFM) and tip-enhanced Raman spectroscopy (TERS). In this work we aim at combining these methods, with the goal of achieving high-resolution Raman, while scanning a surface in KPFM. We are able to fulfill this goal by investigating a test sample consisting of a thin organic film of manganese phthalocyanine deposited on a two dimensional array of silver coated polystyrene spheres. We found that strong interactions between the two methods take place and should be further investigated when KPFM and TERS are being used at the same time.