Regensburg 2013 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 44: Scanning Probe Methods I
O 44.8: Vortrag
Mittwoch, 13. März 2013, 12:15–12:30, H33
Calibrating atomic-scale force sensors installed at the scanning tunneling microscope tip apex — Georgy Kichin1,2, Christian Wagner1,2, Stefan Tautz1,2, and •Ruslan Temirov1,2 — 1Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich — 2JARA-Fundamentals of Future Information Technology
Using the combined low-temperature atomic force and scanning tunneling microscope (LT AFM/STM) we perform simultaneous force and conductance measurements on STM tips decorated with either a single carbonmonoxide molecule or an individual xenon atom. Our results show that both tips act as force sensors coupling the tunneling conductance of the junction to the force acting on the tip. On the basis of the obtained data we attempt the quantitative calibration of the observed sensor function.