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O: Fachverband Oberflächenphysik
O 53: Scanning Probe Methods II
O 53.6: Talk
Wednesday, March 13, 2013, 17:15–17:30, H31
Nanoscale imaging of photoelectrons using an atomic force microscope — •Ping Yu1 and Jürgen Kirschner1,2 — 1Max- Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120 Halle, Germany — 2Martin-Luther-Universität Halle-Wittenberg, Institut für Physik, Von-Danckelmann-Platz 3, D-06120 Halle, Germany
Photoemission current imaging at the nanoscale is demonstrated by combining an atomic force microscope (AFM) with laser excitation of the tip-sample gap. Photoelectrons emitted from the sample are collected by the AFM tip while the tip-sample distance is precisely controlled by the van der Waals force between them. We observe pronounced photoemission current contrast with spatial resolution of 5 nm on a cesium covered Au(111) surface, which is better than its corresponding AFM topography resolution. This high spatial resolution of the photoemission current image can be attributed to the strong dependence of the local potential barrier on the tip-sample distance. Our experiments provide a method for photoelectron imaging with high spatial resolution and extend the functionality of state-of-the-art scanning probe techniques.