Regensburg 2013 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 58: Poster Session III (Solid-liquid interfaces; Scanning probe and other methods; Electronic structure theory; Spin-orbit interaction)
O 58.47: Poster
Mittwoch, 13. März 2013, 18:15–21:45, Poster B1
Infrared subsurface imaging of nanoparticles embedded in textile fibres — •Alfred van Munster1,3, Benedikt Hauer1, Benjamin Glauß2, Wilhelm Steinmann2, Markus Beckers2, Thomas Gries2, and Thomas Taubner1,3 — 1I. Institute of Physics (IA), RWTH Aachen University, Sommerfeldstraße 14, 52074 Aachen, Germany — 2Institut für Textiltechnik ITA, Otto-Blumenthal-Straße 1, 52074 Aachen, Germany — 3Fraunhofer-Institut für Lasertechnik ILT, Steinbachstraße 15, 52074 Aachen, Germany
The mechanical and electrical properties of polymer based materials (e.g. fibres) are affected by additives like nanoparticles [1]. However, it is difficult to detect the location of embedded nanoparticles beneath the surface without damaging the sample. Scattering-type scanning near-field optical microscopy (s-SNOM) offers the opportunity to characterize a sample in such a non-destructive way. The evanescent field at the apex of a sharp, illuminated tip is used to probe the dielectric properties of a material with a sub-wavelength resolution given by the tip radius.
In our sample system siliconcarbide nanoparticles are embedded in polypropylene fibres. At mid-infrared wavelengths the phonon polaritons in SiC resonantly enhance the near-field interaction [2]. We compare the experimental data to reference measurements on bulk SiC and to the calculated predictions of a layered system model [3].
[1] W. Steinmann et al., Text. Res. J. 82, 1846 (2012).
[2] R. Hillenbrand et al., Nature 418, 159 (2002).
[3] B. Hauer et al., Opt. Express 12, 13175 (2012).