Regensburg 2013 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 58: Poster Session III (Solid-liquid interfaces; Scanning probe and other methods; Electronic structure theory; Spin-orbit interaction)

O 58.50: Poster

Mittwoch, 13. März 2013, 18:15–21:45, Poster B1

A simple design to convert an UHV-STM into an AFM — •Stefan Borgsdorf and Ulrich Köhler — Experimentalphysik IV, Ruhr-Universität Bochum, Germany

A simple design of an atomic force microscope (AFM) is presented, by which an ultra high vacuum scanning tunneling microscope (UHV-STM) is converted into an UHV-AFM. For this purpose piezoresistive Cantilevers with bimorph actuator are used. Under these conditions it is less complicated to build up an AFM in vacuum than with an optical readout. In our setup the cantilever is scanning. Therefore the tip is located in the middle of the piezo tube to minimize the crosstalk between different scanning directions as in STM. Another requirement is that it should be able to exchange the sensor in the vacuum chamber and also to create a layout to exchange the sensor type, for example to a qPlus Sensor.