Regensburg 2013 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 58: Poster Session III (Solid-liquid interfaces; Scanning probe and other methods; Electronic structure theory; Spin-orbit interaction)

O 58.58: Poster

Mittwoch, 13. März 2013, 18:15–21:45, Poster B1

Measurements of elastic properties of surfaces with nanometer resolution — •Marina Sarmanova, Erik Thelander, Alexander Malwin Jakob, Jürgen W. Gerlach, Stefan G. Mayr, and Bernd Rauschenbach — Leibniz-Institut für Oberflächenmodifizierung e. V., Permoserstr. 15, D-04318 Leipzig

Quantitative and qualitative measurements of local mechanical properties on nano and ultra-fine scale are useful for both fundamental research of physical properties of the surface and quality control of modern nano-scale devices. The experimental arrangement of mechanical measurements with nanometer resolution is demonstrated. Measurements of Young's modulus of surfaces could be performed with high resolution by means of contact resonance force microscopy (CR-FM) [1]. It is shown that CR-FM technique is suitable for measurements of materials with Young's modulus in a wide range. The local elastic properties of Ge2Sb2Te5, a phase change material well known for its data storage application based on the well-pronounced difference of optical and electrical properties between amorphous and crystalline phases, were investigated. GaN, a semiconductor with wide band-gap, famous for production of high-efficiency diodes and lasers, yields high values of local Young's modulus. This project is funded by Leibniz Association. [1] Rabe U., Arnold W., Appl. Phys. Lett. Vol.64, P1493-1495 (1994)