Regensburg 2013 – wissenschaftliches Programm
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TT: Fachverband Tiefe Temperaturen
TT 58: Poster Session Transport & Matter at Low Temperature
TT 58.13: Poster
Donnerstag, 14. März 2013, 15:00–19:00, Poster D
Joule heating and current-density profiles during electromigration controled gap formation in nanostructures — •Birgit Kießig1,2, Roland Schäfer1, and Hilbert v. Löhneysen1,2 — 1Karlsruher Institut für Technologie, Institut für Festkörperphysik, 76021 Karlsruhe — 2Karlsruher Institut für Technologie, Physikalisches Institut, 76131 Karlsruhe
For molecular electronics gaps between metallic electrodes not larger than a few nm are needed. However, the structuring of such gaps is still a challenging task. One route towards reliable nanogaps utilizes electromigration which is reported to yield extremely small gaps if current and resistance is carefully monitored during the process. Electromigation leads to a continuous thinning out of metallic nanowires at sufficiently large current densities. The main driving force is the so called electron wind, e.g. the momentum transfer from the directional flow of conduction electrons to the atomic cores and the resulting displacement of the latter. However, electromigation depends on elevation of temperature due to Joules heating as well. We present our own experience with so called feedback controlled electromigration and discuss the influence of sample geometry and substrate texture on current-density and temperature profiles.