Berlin 2014 – wissenschaftliches Programm

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MS: Fachverband Massenspektrometrie

MS 6: Poster

MS 6.6: Poster

Mittwoch, 19. März 2014, 14:00–14:00, DO24 Foyer

Ion bunch stacking in a Penning trap after purification in an electrostatic ion-beam trap — •M. Rosenbusch1, D. Atanasov2, K. Blaum3, Ch. Borgmann3, S. Kreim2,3, D. Lunney4, V. Manea4, L. Schweikhard1, F. Wienholtz1, and R. Wolf11Uni Greifswald — 2CERN, CH-1211 Geneva, Switzerland — 3Max-Planck-Institut für Kernphysik, Saupfercheckweg 1, 69117 Heidelberg — 4CSNSM-IN2P3-CNRS, Université Paris-Sud, 91406 Orsay, France

Measurements in analytical mass spectrometry as well as in precision mass determinations for atomic and nuclear physics are often handicapped when the ion sources deliver contaminations, i.e., unwanted ions of masses similar to those of the ions of interest. In particular, in ion-trapping devices, large amounts of contaminant ions result in significant systematic errors. At the Penning-trap mass spectrometer ISOLTRAP (ISOLDE/CERN), ions are purified in a multi-reflection time-of-flight mass separator (MR-ToF MS), which reaches a mass resolving power in excess of 105 in only tens of milliseconds [1,2]. However, the subsequent Penning-trap mass measurements require durations in order of a second. If only a certain maximum amount of ions can be processed simultaneously and the major parts are contaminants, the number of purified ions per mass-measurement cycle is limited. An improvement for such situations has been developed and realized recently [3]. The fast separation procedure of the MR-ToF MS is repeated several times while the purified ions are accumulated in a preparation Penning trap. In this contribution the method is described and proof-of-principle measurements are presented.

[1] R. N. Wolf et al., Nucl. Instrum. Meth. A 686, 82 (2012)

[2] R. N. Wolf et al., Int. J. Mass Spectrom. 349-350, 123 (2013)

[3] M. Rosenbusch et al., Appl. Phys. B, accepted (2013), http://dx.doi.org/10.1007/s00340-013-5702-0

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