Regensburg 2016 – scientific programme
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MM: Fachverband Metall- und Materialphysik
MM 59: Topical session: In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science VII - Nanomaterials
MM 59.7: Talk
Thursday, March 10, 2016, 18:15–18:30, H38
X-ray Nanodiffraction for in situ Microscopy — Christina Krywka1,2, Stephan V. Roth3, and •Martin Müller1 — 1Helmholtz-Zentrum Geesthacht, Max-Planck-Straße 1, D-21502 Geesthacht — 2Christian-Albrechts-Universität, Leibnizstraße 19, D-24118 Kiel — 3DESY, Notkestraße 85, D-22607 Hamburg
The origins of the macroscopic behavior of synthetic and natural high-performance materials can often be found on no less than atomistic length scales. Access to these dimensions is barred for light microscopes while electron microscopes suffer from the low penetration depth of electrons. Consequently, high resolution structural data recorded with external stimuli modified in situ is rare to find. X-ray nanodiffraction is able to overcome these hurdles. That’s because a sub-micrometer sized hard X-ray beam can extract local structural information residing within bulk volumes and from samples inside extended sample environments - given a sufficiently long focal distance. The Nanofocus Endstation of P03 beamline (PETRA III) is a dedicated X-ray nanodiffraction setup. Tensile and indentation stresses, magnetic and electric fields, hydrostatic pressure and fluid shear have all been applied in situ in past nanodiffraction experiments at P03, i.e. while high resolution structural information data were recorded. Not only do these results emphasize our focus on materials science but they also demonstrate why X-ray Nanodiffraction is a genuine in situ microscopy technique.