MM 59: Topical session: In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science VII - Nanomaterials
Donnerstag, 10. März 2016, 15:45–18:30, H38
 |
15:45 |
MM 59.1 |
In situ off-axis electron holography of magnetic nanoparticles — •Rafal E. Dunin-Borkowski, András Kovács, and Jan Caron
|
|
|
|
16:15 |
MM 59.2 |
Advanced AFM based electrical and mechanical characterization of nanostructured materials under controlled environment — •Christian Teichert, Markus Kratzer, Igor Beinik, Christian Ganser, and Franz J Schmied
|
|
|
|
16:45 |
MM 59.3 |
A setup for AFM-based pick-and-place handling of nano-objects inside an SEM — •Uwe Mick, Peter Banzer, Silke Christiansen, and Gerd Leuchs
|
|
|
| |
17:00 |
|
15 min. coffee break
|
|
|
|
17:15 |
MM 59.4 |
In Situ Methods for Studies of Mechanically, Thermally, Electron Beam and Liquid Induced Effects in Nanostructured Materials — •Eva Olsson
|
|
|
|
17:45 |
MM 59.5 |
The role of CTAB micelles in gold nanorod synthesis - a combined SAXS/SANS study — •Tilo Schmutzler, Torben Schindler, and Tobias Unruh
|
|
|
|
18:00 |
MM 59.6 |
Interaction of commensurate charge density waves with anionic point defects in electron beam irradiated 1T-TaSe2 and 1T-TaS2 — •Michael Kinyanjui, Pia Kynrim, Tibor Lehnert, Janis Koster, and Ute Kaiser
|
|
|
|
18:15 |
MM 59.7 |
X-ray Nanodiffraction for in situ Microscopy — Christina Krywka, Stephan V. Roth, and •Martin Müller
|
|
|
