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Regensburg 2016 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 15: STM/AFM: New Approaches

Montag, 7. März 2016, 15:00–18:30, H24

15:00 O 15.1 Imaging Molecules in Atomic Force Microscopy with Carbon Monoxide Terminated Tips — •Nikolaj Moll, Leo Gross, Niko Pavliček, Bruno Schuler, and Gerhard Meyer
15:15 O 15.2 Sub-molecular imaging by NC-AFM with an oxygen atom rigidly connected to a metallic probeOscar Díaz Arado, •Harry Mönig, Diego Rodríguez Hermoso, Milica Todorevic, Alexander Timmer, Simon Schüer, Gernot Langewisch, Rubén Pérez, and Harald Fuchs
15:30 O 15.3 Atomic force microscopy reveals the structure of its tip and subatomic resolution on single iron adatomsMatthias Emmrich, •Ferdinand Huber, Florian Pielmeier, Joachim Welker, Thomas Hofmann, Maximilian Schneiderbauer, Daniel Meuer, Svitlana Poleysa, Sergiy Mankovsky, Diemo Ködderitzsch, Hubert Ebert, and Franz J. Giessibl
15:45 O 15.4 Hauptvortrag: Exploring chemical properties of surfaces by means of Atomic Force Microscopy — •Pavel Jelinek
16:15 O 15.5 Influence of tip sharpness on subatomic resolution capability of atomic force microscopy — •Julian Berwanger, Ferdinand Huber, and Franz Josef Giessibl
16:30 O 15.6 High-resolution AFM/STM imaging and force spectroscopy of van der Walls nanostructures on metal surface — •Martin Svec, Oleksander Stetsovych, Jan Berger, Pavel Hobza, and Pavel Jelinek
16:45 O 15.7 Intramolecular force contrast and dynamic current-distance measurements at room temperature — •Sonia Matencio, Ferdinand Huber, Alfred J. Weymouth, Carmen Ocal, Esther Barrena, and Franz J. Giessibl
17:00 O 15.8 Sub-molecular resolution imaging of molecules by AFM: Pauli versus CoulombJoost van der Lit, •Nadine J. van der Heijden, Francesca Di Cicco, Prokop Hapala, Pavel Jelinek, and Ingmar Swart
17:15 O 15.9 Extending carbon monoxide front atom identification (COFI) to probe the second atomic layer of an AFM tip — •Daniel Meuer, Andreas Bartholomäus Kelbel, and Franz Josef Giessibl
17:30 O 15.10 Understanding high-resolution AFM images of water clusters on NaCl substrate — •Prokop Hapala, Jing Guo, Jinbo Peng, Duanyun Cao, Limei Xu, Enge Wang, Ying Jiang, and Pavel Jelinek
17:45 O 15.11 Scanning quantum dot microscopy made faster — •Christian Wagner, Michael Maiworm, Christian Müller, Matthew F. B. Green, Philipp Leinen, Eric Bullinger, Rolf Findeisen, F. Stefan Tautz, and Ruslan Temirov
18:00 O 15.12 The energy resolution function of a tunnel junction — •Christian R. Ast, Berthold Jäck, Jacob Senkpiel, Matthias Eltschka, Markus Etzkorn, Joachim Ankerhold, and Klaus Kern
18:15 O 15.13 Scanning Tunneling Microscopy at 20 mK — •Timofey Balashov, Michael Meyer, and Wulf Wulfhekel
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