Regensburg 2016 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 15: STM/AFM: New Approaches

O 15.4: Hauptvortrag

Montag, 7. März 2016, 15:45–16:15, H24

Exploring chemical properties of surfaces by means of Atomic Force Microscopy — •Pavel Jelinek — Institute of Physics of the CAS, Cukrovarnicka 10, Praha, Czech Republic

Atomic resolution and manipulation is routinely achieved by both scanning tunneling microscopy (STM) and atomic force microscopy (AFM) nowadays. Despite of large activities in development of the technique, still some challenges remain, namely the chemical sensitivity on atomic level. It was demonstrated that AFM force spectroscopy could provide chemical identity of single atoms [1,2]. In this talk we present two novel methods extending further the chemical sensitivity of AFM. Electronegativity has been an important concept in chemistry, originally defined by Pauling as ’the power of an atom in a molecule to attract electrons to itself’. However its experimental determination is very limited. We present a new methodology to measure Pauling’s electronegativity of individual atoms on surfaces by atomic force microscopy (AFM). Secondly we show that molecular recognition can be achieved using an analysis of characteristic minima (z_min(x,y) and df_min(x,y)) of 3D high-resolution maps combined with theoretical modeling.

[1] Y. Sugimoto et al Nature 446, 64 (2007) [2] M. Setvin et al ACS Nano 6, 6969 (2012)