Regensburg 2016 – wissenschaftliches Programm
O 98.8: Vortrag
Freitag, 11. März 2016, 12:15–12:30, H24
Layer-resolved evolution of perfluoropentacene thin films on Ag(110) surfaces — •Ebrahim Ghanbari, Markus Aiglinger, Andrea Navarro-Quezada, Thorsten Wagner, and Peter Zeppenfeld — Institute of Experimental Physics, Johannes Kepler University, Altenbergerstr. 69, 4040 Linz, Austria
The optical properties of organic thin films depend on the crystallographic structure and orientation. In addition, the interaction with the substrate can strongly affect electronic and optical properties. Here, we apply polarization dependent differential reflectance spectroscopy (pol-DRS)  and photoelectron emission microscopy (PEEM), simultaneously, to study the evolution of perfluoropentacene (PFP) thin films on Ag(110) surface. The adsorption of the organic molecules locally changes photoelectron emission yield of the surface giving rise to the contrast in PEEM. Therefore, PEEM is perfectly suited to study the evolution of the film morphology on the µm scale in real-time whereas, The pol-DRS is employed to investigate the temporal evolution of the (global) optical properties during thin film deposition. The variation of the PEEM and pol-DRS signals during PFP deposition reveal characteristic changes which can be attributed to the completion of subsequent layers and structural phase transition within these layers.
 A. Navarro-Quezada, M. Aiglinger, E. Ghanbari, Th. Wagner, and P. Zeppenfeld, Rev. Sci. Inst. 86, 113108 (2015)