Regensburg 2016 – wissenschaftliches Programm
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TT: Fachverband Tiefe Temperaturen
TT 6: Superconductivity: Properties and Electronic Structure
TT 6.7: Vortrag
Montag, 7. März 2016, 11:45–12:00, H19
Correlating properties and microstructure of YBCO thin films by magnetic X-ray microscopy — •Stephen Ruoß1, Claudia Stahl1, Patrick Zahn1,2, Jonas Bayer1,2, Markus Weigand1, Gisela Schütz1, and Joachim Albrecht2 — 1Max-Planck-Institute for Intelligent Systems, Heisenbergstraße 3, 70569 Stuttgart — 2Research Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstraße 1, 73430 Aalen
The magnetic flux distribution in high-temperature superconductors namely YBCO has been observed using a novel high-resolution technique based on the X-ray magnetic circular dichroism (XMCD) [1,2]. Therefore, a CoFeB layer is deposited on the superconductor which exhibits a strong XMCD-effect. X-ray absorption measurements with circular polarized radiation allows the analysis of the magnetic flux distribution in the superconductor via the soft-magnetic sensor layer [3,4]. In the total electron yield (TEY) mode of the scanning X-ray microscope (SXM) the surface structure and the magnetic domains can be imaged at the same time. Having obtained such high resolution images, the correlation of magnetic flux penetration and defect structure of YBCO thin films can be analyzed.
The measurements have been performed at the scanning X-ray microscope MAXYMUS at Bessy II, HZB Berlin.
[1] S. Ruoß et al., APL 106, 022601 (2015).
[2] C. Stahl et al., EPL 106, 27002 (2014).
[3] C. Stahl et al., PRB 90, 104515 (2014).
[4] C. Stahl et al., J. Appl. Phys. 117, 17D109 (2015).