Dresden 2017 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 86: New Materials

HL 86.7: Vortrag

Freitag, 24. März 2017, 11:30–11:45, POT 112

Submicron scanning X-Ray diffraction imaging of strain in VO₂ microwires. — •Andreas Johannes¹, Jura Rensberg², Carsten Ronning², and Manfred Burghammer¹ — ¹ESRF - The European Synchrotron, 38043 Grenoble, France — ²Institut für Festkörperphysik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, 07743 Jena, Germany

X-Ray diffraction remains the go-to method to identify and characterize the crystal structure of a given material. In general, the small brilliance of lab sources means that large volumes of single crystalline or powdered material have to be investigated, averaging over all localized effects. At the increasing number of synchrotron based, focused X-Ray beam-lines, however, it is becoming possible to perform scanning experiments that yield specially resolved diffraction data. The advantages of this method are highlighted in the scientific case of imaging the strain and multiple-phase-coexistence in VO₂ microwires.