Dresden 2017 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 17: Scanning Probe Techniques: Method Development II
O 17.2: Vortrag
Montag, 20. März 2017, 16:00–16:15, TRE Phy
Measurement of Nano Particle Adhesion by Atomic Force Microscopy — •Daniel Geiger1, Irina Schrezenmeier1, Matthias Roos3, Tobias Neckernuss1, Michael Lehn2, and Othmar Marti1 — 1Institute of Experimental Physics, Ulm University, Albert-Einstein-Allee 11, 89081 Ulm, Germany — 2Institute of Numerical Mathematics, Ulm University, Helmholtzstrasse 20, 89081 Ulm, Germany — 3Carl Zeiss SMT GmbH, Rudolf-Eber-Strasse 2, 73447 Oberkochen, Germany
The adhesiveness of nanoparticles on surfaces is of interest for many applications. This includes processes that are intended to deposit particles on a surface as well as processes that aim to remove nanoparticles from a surface.
We present a method to measure the adhesiveness of nanoparticles by means of lateral force measurements using an atomic force microscope. The measurement protocol is based on conventional contact, constant force mode scanning of a sample decorated with nano beads. By moving the particles laterally their adhesive forces are given as the lateral force acting on the cantilever. Geometry related measurement errors are compensated by statistical analysis. For that reason a model based on probability theory was derived that allows reconstruction of the actual pushing force distribution acting on the beads. The model is applied to measurement data of 50 nm silica nano beads on a silicon substrate.