O 17: Scanning Probe Techniques: Method Development II
Monday, March 20, 2017, 15:45–18:00, TRE Phy
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15:45 |
O 17.1 |
Imaging adatoms, rest atoms and defects on Si(111)-7x7 with a CO terminated metal tip — •Daniel Meuer and Franz Josef Giessibl
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16:00 |
O 17.2 |
Measurement of Nano Particle Adhesion by Atomic Force Microscopy — •Daniel Geiger, Irina Schrezenmeier, Matthias Roos, Tobias Neckernuss, Michael Lehn, and Othmar Marti
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16:15 |
O 17.3 |
Controlled Nanometer Layer Ablation by Diamond AFM tips in a hybrid SEM/AFM — •Frank Hitzel and Jason Kilpatrick
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16:30 |
O 17.4 |
Atomic Force Microscopy with stiff qPlus sensors in liquid environments — •Korbinian Pürckhauer, Alfred J. Weymouth, and Franz J. Giessibl
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16:45 |
O 17.5 |
Imaging successive intermediate states of the on-surface Ullmann reaction — •Daniel Ebeling, Sören Zint, Tobias Schlöder, Sebastian Ahles, Doreen Mollenhauer, Hermann A. Wegner, and Andre Schirmeisen
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17:00 |
O 17.6 |
AFM investigation on CaF2(111) with atomically characterized tips — •Alexander Liebig, Angelo Peronio, Daniel Meuer, Alfred J. Weymouth, and Franz J. Giessibl
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17:15 |
O 17.7 |
HR-LC-AFM for detection of current paths on oxides with atomic resolution — •Christian Rodenbücher, Gustav Bihlmayer, Marcin Wojtyniak, Wolfgang Speier, and Kristof Szot
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17:30 |
O 17.8 |
Scanning tunneling microscopy and potentiometry using a cooled JFET electrometer — •Paul Graf, Meike Flebbe, Christian A. Bobisch, Hermann Nienhaus, and Rolf Möller
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17:45 |
O 17.9 |
Imaging and quantification of work function variations on a nanostructured surface with scanning quantum dot microscopy — •Christian Wagner, Matthew F. B. Green, Philipp Leinen, Michael Maiworm, Taner Esat, Rolf Findeisen, Ruslan Temirov, and F. Stefan Tautz
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