Dresden 2017 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 17: Scanning Probe Techniques: Method Development II
O 17.4: Vortrag
Montag, 20. März 2017, 16:30–16:45, TRE Phy
Atomic Force Microscopy with stiff qPlus sensors in liquid environments — •Korbinian Pürckhauer, Alfred J. Weymouth, and Franz J. Giessibl — University of Regensburg, Germany
We set up a custom-built AFM with qPlus sensors to operate in ambient conditions as well as in liquid environments [1]. For measurements in liquids we immerse the sample in liquid and use long tips, only submerging the tip apex. We discuss the decrease of the Q-factor as a function of the penetration depth of the tip in liquid. The high stiffness of our qPlus sensors (k≥ 1800 N/m) allows us to keep this Q value above 140 during measurements.
Atomic resolution of muscovite mica was achieved both in ambient conditions and in liquid. Beside H2O we used Tris-HCl buffer and a culture medium, which contains salts, a mineral solution, Resazurin, Na2S and other solutes.
[1] Wastl, D. S., Weymouth, A. J., & Giessibl, F. J. (2013). Optimizing atomic resolution of force microscopy in ambient conditions. Physical Review B, 87(24), 245415.