Dresden 2017 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 64: Scanning Probe Techniques: Method development

O 64.2: Poster

Dienstag, 21. März 2017, 18:30–20:30, P2-OG3

Electromechanical contact resonance in band excitation piezoresponse force microscopy — •Sebastian Badur, Thomas Göddenhenrich, and André Schirmeisen — Institut für Angewandte Physik, Justus-Liebig-Universität Gießen, D-35392

Contact resonance atomic force microscopy is a key analyzation method for local piezoresponse or electrochemical strain effects. A drawback of this technique are the various parasitic contributions affecting the signal contrast formation, e.g. a topographical crosstalk, an overall distributed electrostatic force or the stiffness of the mechanical tip-to-sample coupling. In order to investigate and minimize these influences we present an approach using the band excitation method around different cantilever eigenmodes combined with a switching between the electrical cantilever and mechanical sample excitation. Measurements are performed on BaTiO3 under UHV conditions.

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