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Münster 2017 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 67: Pixeldetektoren 3

T 67.1: Vortrag

Dienstag, 28. März 2017, 16:45–17:00, VSH 116

Characterization and grading of the Pixel Vertex Detector modules — •Philipp Leitl for the Belle II collaboration — Max Planck Institute for Physics, Munich

For the upgrade of the Belle detector at the electron positron collider SuperKEKB in Tsukuba, Japan, the vertexing system is completed by a new pixel detector. This Pixel Vertex Detector (PXD) is based on the Depleted P-channel Field-Effect Transistor (DEPFET) technology.

The main production of the detector modules started at the end of 2016 and about 80 modules will be assembled until mid of 2017. During the numerous production steps, several quality assurance measurements are performed to monitor the production yield and to keep track of the performance of every single module.

After the last production step, a full characterization of each module is carried out. The module performance is analyzed with extensive tests and the results are documented in a database. Digital communication on the module and to the readout electronics as well as analog operation of the pixel matrix are covered. A radioactive Cd-109 source and an infrared laser system are used to optimize the response of the modules to signal.

According to the test results, the modules are categorized under a detailed grading scheme to identify the 40 best modules, which will finally form the full detector.

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