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15:00 |
O 97.1 |
Nanosecond time resolution in Electrostatic Force Microscopy — •Riccardo Borgani, Daniel Forchheimer, Per-Anders Thorén, and David B. Haviland
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15:15 |
O 97.2 |
Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy — •Michael Maiworm, Christian Wagner, Ruslan Temirov, F. Stefan Tautz, and Rolf Findeisen
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15:30 |
O 97.3 |
Mapping Light-Induced Cantilever dynamics by Scanned Laser Radiation — •Sven Kraft, Dieter Schick, Semjon Köhnke, Boris Hage, Ingo Barke, and Sylvia Speller
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15:45 |
O 97.4 |
Molecular model of a quantum dot junction beyond the constant interaction approximation — •Ruslan Temirov, Niklas Friedrich, Taner Esat, Philipp Leinen, Matthew F. B. Green, Christian Wagner, Pawel Chmielniak, Jeffrey Rawson, Paul Kögerler, Michael Rohlfing, and F. Stefan Tautz
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16:00 |
O 97.5 |
Intermodulation gain and noise squeezing in dynamic AFM — •David Haviland, Alexander Revera-Ahlin, Daniel Forchheimer, Riccardo Borgani, Thomas Weissl, and Shan Jolin
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16:15 |
O 97.6 |
The contribution has been withdrawn.
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16:30 |
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15 min. break
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16:45 |
O 97.7 |
Low temperature scanning tunneling microscope with optical access — •Lars Wilmes, Kevin Edelmann, Moritz Winkler, Lukas Gerhard, and Wulf Wulfhekel
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17:00 |
O 97.8 |
Evaluating the potential energy above a single molecule at room temperature with lateral force microscopy — •Alfred J. Weymouth, Elisabeth Riegel, Sonia Matencio, and Franz J. Giessibl
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17:15 |
O 97.9 |
Unexpected lateral contrast in Topografiner imaging on sub-Angström corrugations — •Gabriele Bertolini, Robin Pröbsting, Danilo Andrea Zanin, Hugo Cabrera, Urs Ramsperger, Danilo Pescia, and Oguzhan Gürlü
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17:30 |
O 97.10 |
Coherent single electron field emitter assembled with SPM — •Taner Esat, Niklas Friedrich, Ruslan Temirov, and F. Stefan Tautz
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17:45 |
O 97.11 |
Investigation of the significance of higher harmonics in non-contact atomic force microscopy — •Daniel Heile, Alexander von Schmidsfeld, and Michael Reichling
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18:00 |
O 97.12 |
Information content comparison of mulitfrequency afm methods — •Daniel Platz, Daniel Forchheimer, Erik Tholén, and David B. Haviland
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18:15 |
O 97.13 |
Characterising NC-AFM cantilevers by opto-mechanical forces — •Alexander von Schmidsfeld and Michael Reichling
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