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Würzburg 2018 – scientific programme

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T: Fachverband Teilchenphysik

T 41: Halbleiterdetektoren / Strahlenhärte I

Tuesday, March 20, 2018, 16:30–19:00, Z6 - SR 2.010

16:30 T 41.1 Direct Measurement of Optical Cross-Talk in SiPMs Using Light Emission Microscopy — •Derek Strom, Razmik Mirzoyan, and Jürgen Besenrieder
16:45 T 41.2 Direct temperature measurement of SiPMs via IV diode characteristics — •Naomi Vogel, Michael Wagenpfeil, Sebastian Schmidt, Tobias Ziegler, and Thilo Michel
17:00 T 41.3 Characterization of SiPMs after radiation damage — •Sara Cerioli, Erika Garutti, Robert Klanner, David Lomidze, Joern Schwandt, and Milan Zvolsky
17:15 T 41.4 Annealingverhalten von bestrahlten p-Typ Streifendetektoren — •Leena Diehl, Riccardo Mori, Ines Messmer, Marc Hauser, Ulrich Parzefall und Karl Jakobs
17:30 T 41.5 Labormessungen von bestrahlten und unbestrahlten ReinerstrukturenSilke Altenheiner, Sascha Dungs, Andreas Gisen, Claus Gößling, Valerie Hohm, Reiner Klingenberg, Kevin Kröninger, •Anna-Katharina Raytarowski und Mareike Weers
17:45 T 41.6 The GeMSE Low-Background Facility for Meteorite and Material Screening — •Diego Ramírez García
18:00 T 41.7 Shallow angle measurements on prototypes for the CMS Phase II pixel sensors — •Caroline Niemeyer, Aliakbar Ebrahimi, Finn Feindt, Erika Garutti, Daniel Pitzl, Jörn Schwandt, Georg Steinbrück, and Irene Zoi
18:15 T 41.8 Modulbauentwicklung für das Phase-II-Upgrade des äußeren CMS-SpurdetektorsTobias Barvich, Alexander Dierlamm, Ulrich Husemann, •Stefan Maier und Marius Neufeld
18:30 T 41.9 Enhanced lateral drift sensors: concept and development — •Anastasiia Velyka and Hendrik Jansen
18:45 T 41.10 Optimization of bias rail implementations for segmented silicon sensorsMarta Baselga, Alexander Dierlamm, Thomas Müller und •Daniel Schell
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