Regensburg 2019 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 1: Optical Analysis of Thin Films I (Reflection, Ellipsometry, Raman, IR-DUV Spectroscopy, ...

Montag, 1. April 2019, 09:30–11:45, H32

09:30 DS 1.1 Hauptvortrag: Charge and ion exchange at electrochemical interfaces: atomistic insights by means of in-situ ellipsometry — •Christoph Cobet
  10:00 15 min. break
10:15 DS 1.2 Sensing and structure analysis by in situ IR spectroscopy: From ml flow cells to microfluidic applications — •Karsten Hinrichs, Lucjan Grzegorzewski, Andreas Furchner, and Christoph Kratz
10:30 DS 1.3 Reflectance Anisotropy Spectroscopy as an analytical tool for phase transformation studies: order reactions in Cu-Au Thin Films — •Marco Volpi, Alla Sologubenko, Philipp Okle, and Ralph Spolenak
10:45 DS 1.4 Direct band gap of alpha-tin investigated by infrared ellipsometryRigo A. Carrasco, Cesy M. Zamarripa, •Stefan Zollner, and Jose Menendez
11:00 DS 1.5 Temperature induced changes in monolayers observed by sum frequency generation spectroscopy — •Damian Firla, Robert Rameker, Joshua Multhaup, and Eckart Hasselbrink
11:15 DS 1.6 Raman spectroscopy characterization of silicon nanoribbons on Ag(110) — •Dmytro Solonenko, Alexander Ehm, Dietrich R.T. Zahn, and Patrick Vogt
11:30 DS 1.7 Revealing the distinct structural and plasmonic properties of gold nanosponges through FIB nanotomographical reconstruction — •Peter Schaaf, Lars Hauke Honig, and Dong Wang
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