Regensburg 2019 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 1: Optical Analysis of Thin Films I (Reflection, Ellipsometry, Raman, IR-DUV Spectroscopy, ...

DS 1.2: Vortrag

Montag, 1. April 2019, 10:15–10:30, H32

Sensing and structure analysis by in situ IR spectroscopy: From ml flow cells to microfluidic applications — •Karsten Hinrichs, Lucjan Grzegorzewski, Andreas Furchner, and Christoph Kratz — ISAS - e.V., Schwarzschildstr. 8, 12489 Berlin, Germany

The low penetration depths of IR radiation in aqueous solutions poses a challenge for utilizing IR spectroscopy in investigations with macro- and microfluidic flow cells. Probing the solid liquid interface through an IR transparent substrate can be advantageous in such experiments. In situ IR ellipsometry in combination with optical modeling can be applied for detailed analysis of molecular interactions and hydration states of ultrathin functional polymer films. The development of an optofluidic platform incorporating metal-island film substrates for signal enhancement translates this technique to the world of microfluidics. Time-resolved measurements of monolayer formation of organic molecules show that the developed concept can be employed to monitor dynamic processes under in situ conditions in nL volumes.

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