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Regensburg 2019 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 27: Metal Oxide Surfaces I: Structure, Epitaxy and Growth

O 27.8: Vortrag

Dienstag, 2. April 2019, 12:30–12:45, H16

In-situ growth study of Fe3O4/NiO bilayer and NiFe2O4 films using surface sensitive high energy x-ray diffraction — •Martin Hoppe1,2, Tobias Pohlmann1,2, Florian Bertram2, Jannis Thien1, Kevin Ruwisch1, and Joachim Wollschläger11University of Osnabrück, Osnabrück, Germany — 2DESY, Hamburg, Germany

The (inverse-) spinel structure of ferrites displays a large variety of electronic and magnetic properties1, making some of them interesting for potential applications in spintronics. The performance of such ferrites as thin film devices, however, is strongly coupled to the structure and interface of these materials, which are determined by the growth conditions.
With the help of surface sensitive High Energy X-Ray Diffraction (HEXRD) it was possible to record several crystal truncation rods and film reflections simultaneously on a large area Detector and achieve a good time resolution within the few seconds range, which has also been shown with CO oxidation on Pd(100) by Gustafson, et al.2.
In this study, we investigated the growth of Fe3O4/NiO bilayers and NiFe2O4 on both MgO(001) and SrTiO3(001) substrates. By recording simultaneously several CTRs we could follow the evolution the Laue fringes time dependent. By tracing the film peak position as a function of time strain parameters could be extracted as function of film thickness.
[1] K. Kuepper et al., Phys. Rev. B 94.2 (2016), 024401
[2] J. Gustafson et al., Science 343 (2014), 6172 758−761

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