Dresden 2020 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 20: Focus Session: Organic-based Hybrid Thermoelectrics I
DS 20.2: Vortrag
Mittwoch, 18. März 2020, 10:00–10:15, CHE 89
FFT-based Integrated Transient Thermoelectric Measurement Setup for Thin Films — •Karthikeyan Manga Loganathan1,2,3, Guodong Li1,2, Vineeth Kumar Bandari1,2,3, Feng Zhu1,2,3, and Oliver G. Schmidt1,2,3 — 1Material Systems for Nanoelectronics, Chemnitz University of Technology, Chemnitz, Germany — 2Institute for Integrative Nanosciences, Leibniz IFW Dresden, Dresden, Germany — 3Center for Materials, Architectures and Integration of Nanomembranes (MAIN), Chemnitz University of Technology, Chemnitz, Germany
Characterization of thin films for their thermoelectric figures of merit (zT) has been constantly met with the challenges in effectively measuring their thermal conductivity (k), electrical conductivity (σ) & Seebeck coefficient (S) coherently along the same plane. The author's work introduces a novel FFT-based measurement technique that independently measures the above parameters coherently along cross-plane direction for thin films with thicknesses as low as 50 nm. The technique incorporates FFT into the traditional transient measurement strategies of recording second and third harmonic voltage drops from the material in response to AC heating, established by David Cahill et al. [Phys. Rev. B, 1994]. This allows for the simultaneous measurement of the thin film's k and S in the cross-plane direction. The merits of this technique include enhanced ease, efficiency and accuracy of measurement of k, σ & S. The technique has been further employed to characterize organic materials and 2D multilayers such as CuPc, PEDOT, MoS2 and SnS2 for their cross-plane thermoelectric parameters.