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DS: Fachverband Dünne Schichten
DS 28: Poster: Thin Film Properties: Structure, Morphology and Composition
DS 28.18: Poster
Mittwoch, 18. März 2020, 15:00–18:00, P1A
Miniaturization of patterns formed in graded thin elastic film — •Sunita Singh1 and Jayati Sarkar2 — 1Indian Institute of technology, Delhi,India — 2Indian Institute of technology, Delhi,India
We study the instability and morphology of a thin incompressible, inhomogeneous elastic soft film, whose shear modulus is exponential function or arbitrary function of film thickness. An LSA (linear stability analysis) has been done to obtain the minimum stress or force required to perturb the top surface of the film. In our study, we obtained the smaller length scale features can be formed at the interface in these anisotropic (non-homogeneous) materials where the anisotropy exists only in the normal direction. The present work constituted the range of length scale of instability is 0.3h<λ<2.96, lower critical stiffness from LSA and total energy minimization, to look out the evolved morphology with high aspect ratio at the interface of film and contactor. The similar length scale of instability can be obtained using different techniques like patterned substrates and bilayers where it was possible to decrease the length scale by about an order of magnitude than those formed in simple elastic thin films because of antagonistic energies (elastic and interaction) present. These techniques are also cost-effective than the existing techniques of lithography suitable for hard materials. The LSA gives a 4th order ordinary differential equation, which cannot be solved analytically, so we discretized it using finite difference method with 2nd order accuracy throughout the process. The studies involved numerical techniques for energy minimization, and also finite element schemes to tackle non-linearities.