Dresden 2020 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 28: Poster: Thin Film Properties: Structure, Morphology and Composition
DS 28.8: Poster
Mittwoch, 18. März 2020, 15:00–18:00, P1A
The new Neutron Depth Profiling Instrument N4DP at the FRM2 — •Lukas Werner1, Markus Trunk1, Roman Gernhäuser1, Ralph Gilles2, Bastian Märkisch1, and Zsolt Revay2 — 1Technische Universität München — 2Heinz Maier-Leibnitz Zentrum
Neutron Depth Profiling (NDP) is a non-destructive nuclear analytical technique. It uses charged particles produced in neutron capture reactions (for example the neutron capture on 6Li) to map isotope depth distributions in thin film samples. At the Forschungsneutronenquelle München 2 (FRM2) the new Neutron Depth Profiling instrument N4DP has been set up. The high neutron flux available at the experimental site allows for ex-situ as well as for operando studies of thin film samples (e.g. battery anodes during cycling). We will present the capabilities of the instrument alongside several application examples.