Dresden 2020 – scientific programme

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O: Fachverband Oberflächenphysik

O 28: Poster Session - Scanning Probe techniques: Method Development

O 28.1: Poster

Monday, March 16, 2020, 18:15–20:00, P1A

Understanding lateral force microscopy data of organic molecules — •Elisabeth Riegel, Oliver Gretz, Alfred J. Weymouth, and Franz J. Giessibl — Universität Regensburg, Regensburg, Germany

Frequency-modulation lateral force microscopy (LFM) is a variant of the highly-successful frequency-modulation atomic force microscopy in which the direction of the tip oscillation is along the surface. In this geometry, the setup is not sensitive to long-range background forces in the direction of the surface normal, but only to the short-range interactions. To achieve high spatial resolution, we oscillate our tip at sub-Angstrom amplitudes. We applied this technique to study islands of PTCDA on Cu(111). On Cu(111), PTCDA forms roughly a herringbone pattern. In this contribution, we discuss the interpretation and understanding of the frequency shift and dissipation data with a model of the tip-sample interaction including CO bending.