Dresden 2020 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 83: Poster Session - Plasmonics and Nanooptics: Light-Matter Interaction, Spectroscopy

O 83.12: Poster

Mittwoch, 18. März 2020, 18:15–20:00, P2/EG

Far-infrared sum-frequency generation wide-field microscopy — •Richarda Niemann, Riko Kießling, Christopher Winta, Sören Waßerroth, Yujin Tong, Martin Wolf, and Alexander Paarmann — Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin, Germany

Super-resolution microscopy typically makes use of nonlinear-optical effects, such as multi-photon absorption or stimulated emission depletion microscopy, to overcome the diffraction limit of optical beams. In the infrared spectral range, infrared-visible sum-frequency generation (SFG) can provide vibrational contrast with a spatial resolution ultimately limited by the visible SFG wavelength [1]. In particular for far-infrared SFG, this would enable imaging resolution well below λIR/100.

As a proof-of-concept, we recently demonstrated SFG microscopy beyond infrared wavelength of 10 µm for surface phonon polariton resonance imaging [2], using a scanning-focus method. In the current work, we introduce our new approach of SFG wide-field microscopy [1]. Specifically for high-intensity, low-repetition rate lasers, the usage of wide-field nonlinear imaging efficiently avoids otherwise ubiquitous sample damage problems. Here, the laser focal size is adapted to the field-of-view of the imaging system, reducing the laser fluence without deteriorating the microscopes resolution [1].

[1] Hoffmann et al.,Rev. Sci. Instrum, 3221 (2002)

[2] Kiessling et al., ACS Photonics, (2019)

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