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DS: Fachverband Dünne Schichten

DS 23: Optical Analysis of Thin Films (Reflection, Ellipsometry, Raman, IR-DUV Spectroscopy, ...)

DS 23.1: Vortrag

Donnerstag, 8. September 2022, 10:45–11:00, H14

Raman characterisation of composite thin films of PEDOT:PSS and Cu2ZnSnS4 nanocrystals — •Yevhenii Havryliuk1,2,3, Volodymyr Dzhagan3, Oleksandr Selyshchev1,2, and Dietrich R.T. Zahn1,21Semiconductor Physics, Chemnitz University of Technology, Chemnitz, Germany — 2Center for Materials, Architectures, and Integration of Nanomembranes (MAIN), Chemnitz, Germany — 3V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine, Kyiv, Ukraine

The increasing demand for renewable energy sources powers the high research interest in the fields of photovoltaics and thermoelectrics. One of the materials promising in these fields are Cu2ZnSnS4 (CZTS) family compounds. CZTS nanocrystals (NCs) for third generation photovoltaics can be obtained by low-temperature "green" colloidal synthesis. Another material widely studied especially for thermoelectric applications is PEDOT:PSS. Usually these two materials are used as separate layers in devices. However, using them in a composite layer probably can reveal even more interesting properties. Therefore, we investigated such composite films with different polymer/NC ratios. Raman spectroscopy was used as a main characterization method. We detected the modification of the structure of PEDOT:PSS films upon incorporation of NCs and found that the formation of the CZTS NCs films using a drop-casting method occurs differently in the presence of even a small amount of PEDOT:PSS. The change in the stability of the PEDOT:PSS/CZTS composite under intense laser irradiation, in comparison with the pure components, was also investigated.

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