Regensburg 2022 – wissenschaftliches Programm

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 8: Crystallography in Materials Science, Microstructure and Dielectric Properties

KFM 8.7: Vortrag

Montag, 5. September 2022, 17:15–17:35, H7

X-ray diffraction with micrometer spatial resolution for highly absorbing samples — Prerana Chakrabarti^1,2, Anna Wildeis¹, Markus Hartmann¹, Robert Brandt¹, Giovanni Fevola², Christina Ossig^2,3, Michael Stuckelberger², Jan Garrevoet⁴, Ken Vidar Falch⁴, Vanessa Galbierz⁴, Gerald Falkenberg⁴, and •Peter Modregger^1,2 — ¹Universität Siegen — ²CXNS, DESY, Hamburg — ³Universität Hamburg — ⁴DESY, Hamburg

We report on a novel goniometer-based setup for X-ray diffraction at high photon energies with micrometer spatial resolution, which was implemented at the P06 beamline of PETRA III. The 6-axes goniometer features 3 translations with 1 nm accuracy and 3 rotations with 0.1 µrad accuracy and allows for 5D scans: 2 in direct and 3 in reciprocal space. Utilizing X-ray focus sizes of 1 µm at a photon energy of 35 keV provided by P06, enables us to characterize the strain field of a 1 mm thick, poly-crystalline martensitic steel sample with micrometer spatial resolution. Further, we experimentally demonstrate the assessment of elemental distribution by fluorescence simultaneous with diffraction for high-Z materials in a ACIGS thin film solar cell. Future plans include the extension of multimodal experiment including ptychography or XBIC and improving spatial resolutions to 200 nm.