SMuK 2023 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 45: Si-Strips, Pixel

T 45.3: Vortrag

Dienstag, 21. März 2023, 17:30–17:45, WIL/C307

Characterisation and test beam data analysis of passive CMOS strip sensors — •Naomi Davis for the CMOS Strip Detectors collaboration — Deutsches Elektronen Synchrotron DESY, Hamburg, Germany

In high-energy physics, upgrades for particle detectors, as well as studies on future particle detectors are largely based on silicon sensors as tracking devices. The surface that needs to be covered by silicon sensors is constantly increasing so that they become an immense cost driver in particle physics experiments. Consequently, there is a need to investigate new silicon sensor concepts that can realise large-area coverage and cost-efficiency. A promising technology is found in passive CMOS sensors, based on CMOS imaging technology. They provide a lowered sensor cost by being produced in commercial chip processing lines. Since passive CMOS sensors do not contain any active elements they also allow for a large choice of possible vendors and easy portation from one CMOS process to another.

The passive CMOS project at DESY is investigating passive CMOS strip sensors fabricated at LFoundry in a 150nm technology. Two different strip formats of the n-in-p sensor are achieved by the process of stitching. An electrical sensor characterisation is realised by measuring the change in the sensor current and capacitance with the applied bias voltage. In addition, the sensor performance is evaluated based on test beam measurements conducted at the DESY II test beam facility. This presentation will provide a characterisation of passive CMOS strip sensors and results of the test beam data analysis.